Surface Electronic Transport Phenomena in Semiconductors (Series on Semiconductor Science and Technology)

By V.N. Dobrovolsky, V.N. Dobrovolټskiڷi, V.N. Dobrovolskii

Layered metal-insulator-semiconductor microstructures have become an important research topic in semiconductor microelectronics, especially in the development of devices that can directly utilize phenomena occurring at or near the semiconductor surface. This monograph provides a survey of the diverse experimental and theoretical results for electron and hole transport in surface and subsurface regions of semiconductors, with an emphasis on the mechanisms involved and special measurement procedures necessary, for example in Hall current measurements. This English edition has been substantially revised and updated from the original Russian work for the benefit of the intended audience of physicists and electronics engineers working in semiconductor microstructures and low-dimensional semiconductor physics.

• Format: Hardcover
• Language: English
• ISBN: 0198520344
• ISBN13: 9780198520344
• Release Date: November 1991
• Publisher: Clarendon Press
• Length: 232 Pages
• Weight: 1.22 lbs.
• Dimensions: 9.5" x 0.7" x 6.3"