Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2012, Hiroshima, Japan, November 7-9, 2012,

This volume constitutes the refereed proceedings of the Joint IAPR International Workshops on Structural and Syntactic Pattern Recognition (SSPR 2012) and Statistical Techniques in Pattern Recognition (SPR 2012), held in Hiroshima, Japan, in November 2012 as a satellite event of the 21st International Conference on Pattern Recognition, ICPR 2012. The 80 revised full papers presented together with 1 invited paper and the Pierre Devijver award lecture were carefully reviewed and selected from more than 120 initial submissions. The papers are organized in topical sections on structural, syntactical, and statistical pattern recognition, graph and tree methods, randomized methods and image analysis, kernel methods in structural and syntactical pattern recognition, applications of structural and syntactical pattern recognition, clustering, learning, kernel methods in statistical pattern recognition, kernel methods in statistical pattern recognition, as well as applications of structural, syntactical, and statistical methods.

• Format: Paperback
• Language: English
• ISBN: 3642341659
• ISBN13: 9783642341656
• Release Date: September 2012
• Publisher: Springer
• Length: 755 Pages
• Weight: 2.39 lbs.
• Dimensions: 1.5" x 6.1" x 9.2"