Structural Health Monitoring with Piezoelectric Wafer Active Sensors: With Piezoelectric Wafer Active Sensors

By Victor Giurgiutiu

Structural Health Monitoring with Piezoelectric Wafer Active Sensors, Third Edition provides an authoritative theoretical and experimental guide to this fast-paced, interdisciplinary area with exciting applications across a range of industries. It judiciously combines theory, numerical examples, and experiments providing the background needed to fully understand the physical principles involved in performing structural health monitoring (SHM) with piezoelectric wafer active sensor (PWAS) transducers. The book starts with a detailed yet digestible consolidation of the fundamental theory relating to SHM, covering fracture and failure basics, relevant piezoelectric material properties, vibration modes in different structures, and different wave types, providing the background necessary to understand SHM and apply it to real-world structural challenges. From there the book segues to experimental practice covering several complementary methods of using PWAS transducers for SHM applications, such as propagating guided waves (pitch-catch; pulse-echo; phased-array) and standing guided waves. Numerical examples have been added throughout in support of understanding the underlying theory, and the companion website contains MATLAB code, simulation videos, and other supporting materials. An instructor's manual is available upon request for teachers using the book in the classroom. Updates to this 3rd edition include sections covering flexural vibration energy of a beam; bulk wave interaction at interfaces; power and energy of Rayleigh waves; group velocity, power, and energy of shear waves; power and energy of Lamb waves; simplified Helmholtz equations solution through gauge condition manipulation; normal mode expansion solution for Lamb waves tuning; guided wave interaction with damage, hybrid global local method; and determination of wave damage interaction coefficients through local FEM analysis with nonreflective boundaries in the frequency domain.

• Format: Paperback
• Language: English
• ISBN: 0128224452
• ISBN13: 9780128224458
• Release Date: July 2026
• Publisher: Academic Press
• Length: 1056 Pages
• Weight: 0.99 lbs.