Statistical Regression with Measurement Error (Kendall's Library of Statistics)

By John W. Van Ness and Chi-Lun Cheng

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the style of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

• Format: Hardcover
• Language: English
• ISBN: 0340614617
• ISBN13: 9780340614617
• Release Date: May 1999
• Publisher: Hodder Education Publishers
• Length: 288 Pages
• Weight: 0.55 lbs.
• Dimensions: 9.3" x 0.8" x 6.3"