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Statistical Modeling for Computer-Aided Design ...
Edition Description
As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical...
Edition Details
Format:Paperback
Language:English
ISBN:1461363799
Format: Paperback
Condition:
$
109.99
50 Available
Statistical Modeling for Computer-Aided Design ...
Edition Description
As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical...
Edition Details
Format:Hardcover
Language:English
ISBN:079239299X
Format: Hardcover
Condition:
$
109.99
50 Available
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