Statistical Methods for SPC and TQM (Chapman & Hall/CRC Texts in Statistical Science)

By Derek Bissell and D Bissell

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices. Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered. Contents Data Collection and Graphical Summaries Numerical Data Summaries-Location and Dispersion Probability and Distribution Sampling, Estimation, and Confidence Sample Tests of Hypothesis; "Significance Tests" Control Charts for Process Management and Improvement Control Charts for Average and Variation Control Charts for "Single-Valued" Observations Control Charts for Attributes and Events Control Charts: Problems and Special Cases Cusum Methods Process Capability-Attributes, Events, and Normally Distributed Data Capability; Non-Normal Distributions Evaluating the Precision of a Measurement System (Gauge Capability) Getting More from Control Chart Data SPC in "Non-Product" Applications Appendices

• Format: Hardcover
• Language: English
• ISBN: 0412394405
• ISBN13: 9780412394409
• Release Date: January 1994
• Publisher: Chapman and Hall/CRC
• Length: 386 Pages
• Weight: 1.40 lbs.
• Dimensions: 11.2" x 1.1" x 8.5"
• Grade Range: Postsecondary and higher