Spectroscopy in Catalysis: An Introduction

By J.W. Niemantsverdriet

Book Overview

Both textbook and monograph, 'Spectroscopy in Catalysis' describes the most important modern analytical techniques used to investigate catalysts or related systems, such as thin films and single crystals that are used to model catalytic surfaces. These techniques include electron spectroscopies (XPS, UPS, AES, EELS), ion spectroscopies (SIMS, SNMS, RBS, LEIS), vibrational spectroscopies (infrared and Raman spectroscopy, EELS), mass spectroscopic and temperature programmed techniques (TPR, TPO, TDS), diffraction (XRD, LEED, EXAFS), and microscopy (TEM, SEM, STEM, STM, AFM, FEM and FIM). Like a monograph, it covers recent research. Like a textbook, it offers numerous graphics to explain the basics of each spectroscopic technique. Each chapter provides current applications to illustrate the type of information that the technique provides and evaluates the possibilities and limitations of the technique. 'This is a truly valuable book ... particularly attractive for students starting their research in catalysis ... has a superb pedagogic value.' Journal of Catalysis

• Format: Paperback
• Language: English
• ISBN: 3527287264
• ISBN13: 9783527287260
• Release Date: January 1995
• Publisher: Wiley-VCH
• Length: 289 Pages
• Weight: 1.28 lbs.
• Dimensions: 9.5" x 0.6" x 6.8"