Simulink Library Development and Implementation for VLSI Testing

By Gurinder pal Singh

In testing two important factors which are used to check the complexity level of the CUT (Circuit under Test) is COM (Controllability and Observability Measures). Normally for their calculations... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3659130435
• ISBN13: 9783659130434
• Release Date: May 2012
• Publisher: LAP Lambert Academic Publishing
• Length: 84 Pages
• Weight: 0.30 lbs.
• Dimensions: 0.2" x 6.0" x 9.0"