Semiconductor Strain Metrology: Principles and Applications

By Terence K.S. Wong

This book surveys the major and newly developed techniques for semiconductor strain metrology. Semiconductor strain metrology has emerged in recent years as a topic of great interest to researchers... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 160805554X
• ISBN13: 9781608055548
• Release Date: February 2018
• Publisher: Bentham Science Publishers
• Length: 144 Pages
• Weight: 1.06 lbs.
• Dimensions: 0.4" x 8.5" x 11.0"