Semiconductor Memories: Technology, Testing, and Reliability

By Ashok K. Sharma

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.

• Format: Hardcover
• Language: English
• ISBN: 0780310004
• ISBN13: 9780780310001
• Release Date: September 2002
• Publisher: Wiley-IEEE Press
• Length: 480 Pages
• Weight: 2.40 lbs.
• Dimensions: 1.2" x 7.3" x 10.3"