Semiconductor Characterization: Present Status and Future Needs

By Alain C. Diebold, W. Murray Bullis, W. Murray Bulis D. G. Seiler,Bullis,W. Murray Bullis,A. C. Diebold

This book serves as a baseline reference for the characterization of semiconductors for the next decade. It includes sections devoted to characterization for silicon IC development and manufacturing... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 1563965038
• ISBN13: 9781563965036
• Release Date: November 1995
• Publisher: Amer Inst of Physics
• Length: 729 Pages
• Weight: 4.35 lbs.
• Dimensions: 10.5" x 1.8" x 9.0"