Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

By Paul Van Der Heide

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) - Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations - Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission - Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) - Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions - Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

• Format: Hardcover
• Language: English
• ISBN: 1118480481
• ISBN13: 9781118480489
• Release Date: September 2014
• Publisher: Wiley
• Length: 384 Pages
• Weight: 1.45 lbs.
• Dimensions: 0.9" x 6.2" x 9.3"