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Scanning Transmission Electron Microscopy: Adva...

Edition Description

Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements...

Edition Details

Format:Hardcover

Language:English

ISBN:0367197367

Format: Hardcover

Condition:

150.00

50 Available

Quantity:

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Scanning Transmission Electron Microscopy: Adva...

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