Scanning Microscopy for Nanotechnology: Techniques and Applications

By Weilie Zhou and ZHOU WEILIE ET.AL

Book Overview

Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and DualBeam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.

• Format: Paperback
• Language: English
• ISBN: 1441922091
• ISBN13: 9781441922090
• Release Date: October 2010
• Publisher: Springer
• Length: 522 Pages
• Weight: 1.64 lbs.
• Dimensions: 1.1" x 6.1" x 9.2"