Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

By Dror Sarid

This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.

• Format: Hardcover
• Language: English
• ISBN: 019509204X
• ISBN13: 9780195092042
• Release Date: August 1994
• Publisher: Oxford University Press
• Length: 288 Pages
• Weight: 1.57 lbs.
• Dimensions: 0.9" x 6.5" x 9.6"