Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

By Joseph I. Goldstein, Nicholas W M Ritchie, David C Joy, et al.

Book Overview

An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities across the globe. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens.

• Format: Hardcover
• Language: English
• ISBN: 0306472929
• ISBN13: 9780306472923
• Release Date: January 2003
• Publisher: Springer
• Length: 689 Pages
• Weight: 3.75 lbs.
• Dimensions: 1.4" x 7.3" x 9.9"

Customer Reviews

Excellent book for all types of audience

It was a privilege to learn the subjects of SEM and TEM from the the author of this book himself (David Joy). This is an excellent book which starts from the basics and it depends on the researcher how deep he wanna go. The book provides in depth analysis as well if required. Great resource book.

Excellent text

Goldstein et al have written a book that serves as an excellent introduction to the SEM, and is also a formidable reference. When I took SEM at NC State University, it was taught from this book. Between our professor and this text, I learned the ins and outs of the SEM, and I keep the book within arms reach whenever I'm at work.Goldstein covers everything from the basics of operation, through image formation, sample prep, usage in particular fields of study -- everything! If you get one SEM book, get this one.

A very good text book to own

This is an excellent textbook for graduate students majoring in Materials Science. The text is easy to read, and accompanied by plenty of photographs and schematics, is easy to understand. Covers almost every aspect of SEM and X-ray micro-analysis e.g. underlying science, technology, and practical use. Each chapter begins at a basic level and gradually develops the subject to intricate detail, and depending on the level of study one may skip chapters or part of a chapter.

Excellent resource for Electron Microscopists

This book, although not the newest textbook on the market, is THE textbook to have if you are looking for the history, theory or applications of electron microscopy and x-ray microanalysis. Well written, thorough and packed full of well-designed diagrams illustrating the principles described. I've used this textbook in classroom and laboratory settings with excellent results. Looking forward to the next edition!