Scanning Electron Microscopy and X-Ray Microanalysis (Analytical Chemistry by Open Learning)

By Graham Lawes

This practical introduction to the use of scanning electron microscopy (SEM) covers in detail instrumentation, sample preparation, and X-ray microanalysis and instrumentation. Emphasis is on developing an understanding of SEM and becoming proficient at its procedures. Mathematics is kept to a minimum. The chapter on instrumentation covers principles of operation, specimen/electrode interactions, detectors, and operating conditions and limitations. The chapter on specimen preparation discusses specimen characteristcis, drying techniques, coating, and cryo-SEM. The chapter on X-ray microanalysis describes wavelength dispersive systems, energy dispersive systems, operating conditions and limitations, data handling, and other surface analytical techniques. Contains self-assessment questions and responses.

• Format: Paperback
• Language: English
• ISBN: 047191391X
• ISBN13: 9780471913917
• Release Date: August 1987
• Publisher: Wiley
• Length: 122 Pages
• Weight: 0.44 lbs.
• Dimensions: 9.0" x 0.3" x 6.0"