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Hardcover RF and Time-Domain Techniques for Evaluating Novel Semiconductor Transistors Book

ISBN: 303077774X

ISBN13: 9783030777746

RF and Time-Domain Techniques for Evaluating Novel Semiconductor Transistors

This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures. The author explains how to use conventional RF and time- domain measurements to characterize the performance of the transistors. In addition, he explains how novel...

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Format: Hardcover

Condition: New

$99.99
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Related Subjects

Engineering Technology

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