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Paperback Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development Book

ISBN: 1461375967

ISBN13: 9781461375968

Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

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Book Overview

The international market is very competitive for high-tech manufacturers to- day. Achieving competitive quality and reliability for products requires leader- ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de- sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects...

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