Reliability Wearout Mechanisms in Advanced CMOS Technologies

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Reliability Wearout Mechanisms

By Alvin W. Strong, Ernest Y. Wu, Giuseppe La Rosa, et al.

Edition Description

This invaluable resource tells the complete story of failure mechanisms--from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability...

Edition Details

Format:Hardcover

Language:English

ISBN:0471731722

Format: Hardcover

Condition:

192.00

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Reliability Wearout Mechanisms

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