Reliability Study Of Ingap/gaas Heterojunction Bipolar Transistors

By Xiang Liu

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• Format: Paperback
• Language: English
• ISBN: 3639700503
• ISBN13: 9783639700503
• Release Date: October 2013
• Publisher: Scholars' Press
• Length: 100 Pages
• Weight: 0.35 lbs.
• Dimensions: 0.2" x 6.0" x 9.0"