Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures

by Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

Book Overview

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

• Format: Paperback
• Language: English
• ISBN: 148998254X
• ISBN13: 9781489982544
• Release Date: October 2014
• Publisher: Springer
• Length: 195 Pages
• Weight: 0.70 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"