Reliability Issues in Ultra-Scaled Flash Memories

By Michele Ghidotti

The constant improvements in the silicon technology have resulted in a continuous reduction of the electron devices feature size. These technological developments strongly impact in device... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3639293614
• ISBN13: 9783639293616
• Release Date: September 2010
• Publisher: VDM Verlag
• Length: 180 Pages
• Weight: 0.60 lbs.
• Dimensions: 0.4" x 6.0" x 9.0"