Reliability and Radiation Effects in Compound Semiconductors

By Allan Johnston

This book discusses reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. Johnston?s perspective in the book focuses on high-reliability... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 981427710X
• ISBN13: 9789814277105
• Release Date: April 2010
• Publisher: World Scientific Publishing Company
• Length: 376 Pages
• Weight: 1.50 lbs.
• Dimensions: 1.0" x 6.2" x 9.0"