Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits)

By M.J. Howes and David Vernon Morgan

Book by Howes, M. J., Morgan, David Vernon This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0471280283
• ISBN13: 9780471280286
• Release Date: January 1981
• Publisher: J. Wiley
• Length: 444 Pages
• Weight: 1.80 lbs.
• Dimensions: 3.0" x 3.0"