Rapid Reliability Assessment of Vlsics

By A.P. Dorey, A.M.D. Richardson, Y.Z. Xu, et al.

Book Overview

The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1461278791
• ISBN13: 9781461278795
• Release Date: March 2012
• Publisher: Springer
• Length: 212 Pages
• Weight: 0.77 lbs.
• Dimensions: 0.5" x 6.7" x 9.6"