Random Testing of Digital Circuits: Theory and Applications

By René David

"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

• Format: Hardcover
• Language: English
• ISBN: 0824701828
• ISBN13: 9780824701826
• Release Date: April 1998
• Publisher: CRC Press
• Length: 500 Pages
• Weight: 1.88 lbs.
• Dimensions: 1.1" x 6.3" x 9.3"