Quantitative Measurements of Nano Forces using Atomic Force Microscopy (AFM) - Quantifying Nano Forces in Three-Dimensions using AFM: Applications in

By Jolanta A Watson

The atomic force microscope (AFM) was originally utilised for its imaging capabilities. The full potential of the AFM as a three-dimensional force profiling instrument is only now being realised in an... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3639024613
• ISBN13: 9783639024616
• Release Date: June 2008
• Publisher: VDM Verlag Dr. Mueller E.K.
• Length: 176 Pages
• Weight: 0.54 lbs.
• Dimensions: 0.4" x 6.0" x 9.0"