Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions

by Harald Overhof and Johann-Martin Spaeth

Book Overview

The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap- peared about 10 years ago. Since then a very active development has oc- curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor- rections...

• Format: Paperback
• Language: English
• ISBN: 3642627226
• ISBN13: 9783642627224
• Release Date: September 2012
• Publisher: Springer
• Length: 492 Pages
• Weight: 1.55 lbs.
• Dimensions: 1.0" x 6.1" x 9.2"