Phase Change Memory: Device Physics, Reliability and Applications

Book Overview

Includes a complete overview of the phase change memory technology and physics of its operation

Details thermal models alongside crystallization kinetics models

Covers key reliability features with an in-depth discussion of physical mechanisms that are currently limiting PCM capabilities

Offers an overview of device architectures, array management and future applications

• Format: Hardcover
• Language: English
• ISBN: 3319690523
• ISBN13: 9783319690520
• Release Date: November 2017
• Publisher: Springer
• Length: 330 Pages
• Weight: 1.47 lbs.
• Dimensions: 0.8" x 6.1" x 9.2"