Parametric Reliability of Space-Based Field Programmable Gate Arrays

By Joseph C. Pomager

The high cost of failure for microelectronic devices operating in the space environment has led to a need for an accurate characterization of a device's reliability prior to being deployed. In... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1288311508
• ISBN13: 9781288311507
• Release Date: November 2012
• Publisher: Biblioscholar
• Length: 88 Pages
• Weight: 0.38 lbs.
• Dimensions: 0.2" x 7.4" x 9.7"