Parametric Reliability of Space-Based Field Programmable Gate Arrays

All Formats & Editions

1 - 1 of 1 results found

Sort by:

Parametric Reliability of Space-Based Field Pro...

Edition Description

The high cost of failure for microelectronic devices operating in the space environment has led to a need for an accurate characterization of a device's reliability prior to being deployed. In addition, significant cost savings can be achieved by determining this reliability...

Edition Details

Format:Hardcover

Language:English

ISBN:1025119622

Format: Hardcover

Condition:

29.95

Quantity:

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Copyright © 2026 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Notice | Cookie Preferences | Accessibility Statement
ThriftBooks ^® and the ThriftBooks ^® logo are registered trademarks of Thrift Books Global, LLC

All Formats & Editions

Parametric Reliability of Space-Based Field Pro...

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

Follow Us