Optical Characterization of Epitaxial Semiconductor Layers

By Günther Bauer

The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade. In particular, the dramatic... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 354059129X
• ISBN13: 9783540591290
• Release Date: December 1995
• Publisher: Springer
• Length: 429 Pages
• Weight: 1.70 lbs.
• Dimensions: 9.8" x 0.8" x 6.8"