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Noncontact Atomic Force Microscopy
Edition Description
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it...
Edition Details
Format:Hardcover
Language:English
ISBN:3540431179
Format: Hardcover
Condition:
$
219.99
Noncontact Atomic Force Microscopy
Edition Description
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it...
Edition Details
Format:Paperback
Language:English
ISBN:3642627722
Format: Paperback
Condition:
$
219.99
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