Noncontact Atomic Force Microscopy: Volume 2

Book Overview

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

• Format: Paperback
• Language: English
• ISBN: 3642260705
• ISBN13: 9783642260704
• Release Date: March 2012
• Publisher: Springer
• Length: 401 Pages
• Weight: 1.29 lbs.
• Dimensions: 0.9" x 6.1" x 9.2"