Near Field Emission Scanning Electron Microscopy

By Taryl L Kirk

Low beam energies have been implemented in a simplified SEM technique; where the electron source, remote in standard SEMs, is brought within tens of nanometers to the object. This method, known as the... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3832525181
• ISBN13: 9783832525187
• Release Date: August 2010
• Publisher: Logos Verlag Berlin
• Length: 97 Pages