Near-field Characterization of Photonic Nanodevices: Near-field Scanning Optical Microscopy (NSOM) characterization of photonic nanodevices and nanoscale optical phenomena

By Maxim Abashin

The increasing density of data transmission, speed of all-optical signal processing, and demand for higher resolution microscopy and spectroscopy stimulate the development of the nanophotonics. Near-... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3838307119
• ISBN13: 9783838307114
• Release Date: August 2009
• Publisher: LAP Lambert Academic Publishing
• Length: 100 Pages
• Weight: 0.35 lbs.
• Dimensions: 0.2" x 6.0" x 9.0"