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Multi-Run Memory Tests for Pattern Sensitive Fa...
Edition Description
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run...
Edition Details
Format:Hardcover
Language:English
ISBN:3319912038
Format: Hardcover
Condition:
$
59.87
Multi-Run Memory Tests for Pattern Sensitive Fa...
Edition Description
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run...
Edition Details
Format:Paperback
Language:English
ISBN:3030081982
Format: Paperback
Condition:
$
59.87
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