Modern Map Methods in Particle Beam Physics, Volume 108 (Advances in Imaging and Electron Physics)

Advances in Imaging & Electron Physics merges two long-running serials-- Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy . The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Format: Hardcover
• Language: English
• ISBN: 0120147505
• ISBN13: 9780120147502
• Release Date: September 1999
• Publisher: Academic Press
• Length: 318 Pages
• Weight: 1.37 lbs.
• Dimensions: 0.8" x 6.0" x 9.0"