Modeling and Multiresolution Characterization of Micro/nano Surface

By Rajib Mukherjee

Various statistical features can be used to characterize the surface in quantitative way. Such an analysis can be done by the multi-resolution capabilities of wavelet transforms (WT) of the surface... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3639266129
• ISBN13: 9783639266122
• Release Date: July 2010
• Publisher: VDM Verlag
• Length: 124 Pages
• Weight: 0.42 lbs.
• Dimensions: 0.3" x 6.0" x 9.0"