Mismatch Theory And Measurement For Semiconductors

By Mike Peralta

THE MOST ADVANCED SEMICONDUCTOR MISMATCH TECHNIQUES These mismatch methods are the most advanced techniques in the Semiconductor field. All the practical matters of simulation, measurement, and... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1492124958
• ISBN13: 9781492124955
• Release Date: August 2013
• Publisher: Createspace Independent Publishing Platform
• Length: 288 Pages
• Weight: 1.48 lbs.
• Dimensions: 0.6" x 8.5" x 11.0"