Microelectronic Test Structures for CMOS Technology

By Manjul Bhushan and Mark B. Ketchen

Book Overview

Introduction.- Test Structure Basics.- Resistors.- Capacitors.- MOSFETs.- Ring Oscillators.- High Speed Characterization.- Test Structures of SOI Technology.- Test Equipment and Measurements.- Data Analysis.

• Format: Paperback
• Language: English
• ISBN: 1489990550
• ISBN13: 9781489990556
• Release Date: October 2014
• Publisher: Springer
• Length: 373 Pages
• Weight: 1.25 lbs.
• Dimensions: 0.8" x 6.1" x 9.2"