Microelectronic Test Structures for CMOS Technology

By Manjul Bhushan and Mark B. Ketchen

Book Overview

Introduction.- Test Structure Basics.- Resistors.- Capacitors.- MOSFETs.- Ring Oscillators.- High Speed Characterization.- Test Structures of SOI Technology.- Test Equipment and Measurements.- Data Analysis.

• Format: Hardcover
• Language: English
• ISBN: 1441993762
• ISBN13: 9781441993762
• Release Date: August 2011
• Publisher: Springer
• Length: 373 Pages
• Weight: 1.64 lbs.
• Dimensions: 0.9" x 6.1" x 9.2"