Microelectronic Reliability: Integrity Assessment and Assurance

By Emiliano Pollino

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0890063508
• ISBN13: 9780890063507
• Release Date: April 1989
• Publisher: Artech House Publishers
• Length: 556 Pages
• Weight: 2.65 lbs.
• Dimensions: 1.6" x 6.3" x 9.3"