Microelectronic Failure Analysis: Desk Reference

By EDFAS Desk Reference Committee

Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/chemical defect characterization. For the fourth ed

• Format: Hardcover
• Language: English
• ISBN: 0871706385
• ISBN13: 9780871706386
• Release Date: November 1999
• Publisher: Asm Intl
• Length: 643 Pages
• Weight: 3.70 lbs.
• Dimensions: 11.3" x 1.5" x 7.8"