Metrology and Physical Mechanisms in New Generation Ionic Devices

By Umberto Celano

Book Overview

This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.

• Format: Paperback
• Language: English
• ISBN: 3319819062
• ISBN13: 9783319819068
• Release Date: June 2018
• Publisher: Springer
• Length: 175 Pages
• Weight: 0.63 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"