Skip to content
Scan a barcode
Scan
Paperback Metrology and Physical Mechanisms in New Generation Ionic Devices Book

ISBN: 3319819062

ISBN13: 9783319819068

Metrology and Physical Mechanisms in New Generation Ionic Devices

Select Format

Select Condition ThriftBooks Help Icon

Recommended

Format: Paperback

Condition: New

$109.99
50 Available
Ships within 2-3 days

Book Overview

This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes...

Customer Reviews

0 rating
Copyright © 2024 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks® and the ThriftBooks® logo are registered trademarks of Thrift Books Global, LLC
GoDaddy Verified and Secured