Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- And Nanoelectronics: Volume 990: Symposium Held April 10 12, 20

In 2004, the microelectronics industry quietly ushered in the Nanoelectronics Era with the mass production of sub-100nm node devices. The current leading-edge semiconductor chips in mass production -... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1107408717
• ISBN13: 9781107408715
• Release Date: June 2014
• Publisher: Cambridge University Press
• Length: 358 Pages
• Weight: 1.05 lbs.
• Dimensions: 0.7" x 6.0" x 9.0"