Logo Recognition: Theory and Practice

By Lizhe Wang, Jingying Chen, Dan Chen

The first book to focus on logo recognition, this text presents a new logo recognition system based on line pattern features. To achieve the desired accuracy and efficiency, the system employs a conceptually simple three-stage hierarchy that includes polygonal approximation, indexing, and matching. In the first stage, raw logos are transformed into normalized line segment maps. In the second stage, effective line pattern features are used to index the database in order to generate a moderate number of likely models. In the third stage, an improved Line Segment Hausdorff Distance (LHD) measure screens and generates the best matches.

• Format: Paperback
• Language: English
• ISBN: 1138116750
• ISBN13: 9781138116757
• Release Date: July 2017
• Publisher: CRC Press
• Length: 194 Pages
• Weight: 0.61 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"