Lock-In Thermography: Basics and Use for Evaluating Electronic Devices and Materials

by Martin C. Schubert, Martin Langenkamp, Otwin Breitenstein, et al.

Book Overview

In the last 7 years, the ?rst edition of "Lock-in Thermography" has established as a reference book for all users of this technique for investigating electronic devices, especially solar cells. At this time, a vital further development of lock-in therm- raphy could be observed. Not only the experimental technique was improved by applying new and better infrared cameras, solid immersion lenses, and novel t- ing strategies, but also completely new application...

• Format: Hardcover
• Language: English
• ISBN: 3642024165
• ISBN13: 9783642024160
• Release Date: September 2010
• Publisher: Springer
• Length: 258 Pages
• Weight: 1.10 lbs.
• Dimensions: 0.8" x 6.3" x 9.2"